Characterization of Materials

Course content

Theory behind various material characterization techniques. Transmission electron microscopy (TEM), scanning electron miscroscopy (SEM), advanced X-ray diffraction (XRD) techniques, atomic force microscopy (AFM). Fourier-transform infrared spectroscopy (FTIR), ultraviolet/visible spectroscopy(UV/VIS), Raman spectroscopy. Differential thermal analysis (DTA), thermogravimetric analysis ( (TGA), differential scanning calorimetry (DSC). Dynamic light scattering (DLS), zeta potential analysis, Vibrating-sample magnetometer (VSM), Hall effect set-up.