Electron Microscopy in Materials Science

Course content

History of electron microscope, optical column and dedection systems, concepts of signal and noise, resolution, depth of field, elastic and inelastic scattering, X-ray production, secondary electrons, back-scattered electrons, Auger electrons, contrast mechanisms, electron back-scattered diffraction, X-ray spectroscopy, miscellaneous scanning electron microscopy tehniques, pseudo-coloring and image analyses.